Title :
Using built-in sensors to cope with long duration transient faults in future technologies
Author :
Lisboa, C.A. ; Kastensmidt, F.L. ; Neto, E.H. ; Wirth, Glen ; Carro, Luigi
Author_Institution :
Inst.de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre
Abstract :
Transients spanning more than one clock cycle will challenge soft error tolerant designs for future technologies. To face this problem, a low overhead technique that uses bulk built-in current sensors and recomputation is proposed here.
Keywords :
adders; electric sensing devices; fault diagnosis; integrated circuit design; integrated circuit reliability; radiation hardening (electronics); transients; adder circuits hardening; built-in current sensors; digital system fault tolerance; digital system reliability; long duration transient faults; low overhead technique; silicon ionization detection; single event transients; soft error tolerant designs; transients spanning; Circuit faults; Clocks; Fault tolerant systems; Frequency; Pulse circuits; Redundancy; Sensor systems; Silicon; Single event upset; Switches;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437631
