DocumentCode
2853498
Title
Using built-in sensors to cope with long duration transient faults in future technologies
Author
Lisboa, C.A. ; Kastensmidt, F.L. ; Neto, E.H. ; Wirth, Glen ; Carro, Luigi
Author_Institution
Inst.de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
10
Abstract
Transients spanning more than one clock cycle will challenge soft error tolerant designs for future technologies. To face this problem, a low overhead technique that uses bulk built-in current sensors and recomputation is proposed here.
Keywords
adders; electric sensing devices; fault diagnosis; integrated circuit design; integrated circuit reliability; radiation hardening (electronics); transients; adder circuits hardening; built-in current sensors; digital system fault tolerance; digital system reliability; long duration transient faults; low overhead technique; silicon ionization detection; single event transients; soft error tolerant designs; transients spanning; Circuit faults; Clocks; Fault tolerant systems; Frequency; Pulse circuits; Redundancy; Sensor systems; Silicon; Single event upset; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2007.4437631
Filename
4437631
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