• DocumentCode
    2853624
  • Title

    SEMINET: further advances in integrated device/circuit simulation for power electronics

  • Author

    Van Dell, W.R. ; Kyle, W.K.

  • Author_Institution
    General Electric Co., Research Triangle Park, NC, USA
  • fYear
    1988
  • fDate
    11-14 April 1988
  • Firstpage
    69
  • Abstract
    SEMINET, a power circuit simulator with an integral device simulator, is reviewed, and enhancements are described. Development and simulation of a dynamic insulated-gate-transistor (IGT) model using SEMINET is discussed, and insights into IGT behavior during turn-off are presented. Simulation of an IGT-based half-bridge circuit is described, and the large-signal transient behavior and interaction of the IGT and flyback diode are examined.<>
  • Keywords
    circuit analysis computing; insulated gate field effect transistors; semiconductor device models; SEMINET; dynamic insulated-gate-transistor; flyback diode; half-bridge circuit; integrated device/circuit simulation; large-signal transient behavior; power electronics; semiconductor device models; Analytical models; Circuit simulation; Equations; Physics; Power system modeling; Power system simulation; Semiconductor devices; Signal design; Time domain analysis; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1988. PESC '88 Record., 19th Annual IEEE
  • Conference_Location
    Kyoto, Japan
  • Type

    conf

  • DOI
    10.1109/PESC.1988.18117
  • Filename
    18117