Sigma-delta ADC characterization using noise transfer function pole-zero tracking

Author

Kim, Hochul ; Lee, Kye-shin

Author_Institution

Texas Instrum. Inc., Dallas, TX

fYear

2007

fDate

21-26 Oct. 2007

Firstpage

1

Lastpage

9

Abstract

This work presents a new characterization method for SigmaDelta ADCs using noise transfer function pole zero tracking. In this scheme, the ADC poles and zeros are extracted from the measured FFT-plot. Furthermore, the pole-zero behavior with respect to test conditions including supply voltage, bias current and reference voltage can be analyzed. As a result, the pole-zero sensitivity to each test condition can be separately obtained. This can overcome the drawbacks of the conventional test method which mainly focuses on analyzing the FFT-plots and SNR value.

Keywords

CMOS integrated circuits; fast Fourier transforms; integrated circuit noise; integrated circuit testing; poles and zeros; sensitivity; sigma-delta modulation; transfer functions; CMOS technology; FFT-plot; noise transfer function; pole-zero sensitivity; pole-zero tracking; sigma-delta ADC characterization; test conditions; Current supplies; Delta-sigma modulation; Instruments; Noise level; Noise shaping; Poles and zeros; Signal to noise ratio; Testing; Transfer functions; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2007. ITC 2007. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

978-1-4244-1127-6

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2007.4437654

Filename

4437654