• DocumentCode
    2853870
  • Title

    Dynamic Behavior of a 21-Level (Line-to-Line) BTB System Based on Series Connection of Sixteen Converter-Cells under a Single-Line-to-Ground Fault Condition: Experimental Verification by a 200-V, 20-kW Laboratory System

  • Author

    Hagiwara, Makoto ; Wada, Keiji ; Fujita, Hideaki ; Akagi, Hirofumi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol.
  • Volume
    2
  • fYear
    2006
  • fDate
    8-12 Oct. 2006
  • Firstpage
    1001
  • Lastpage
    1008
  • Abstract
    This paper deals with dynamic behavior of a 21-level (line-to-line) BTB system based on series connection of sixteen converter-cells under a single-line-to-ground (SLG) fault condition. When the SLG fault happens, an imbalance in the supply voltage brings an amount of negative-sequence current to the BTB system. The negative-sequence current should be mitigated because it would result in an increased supply current and a dc-capacitor voltage fluctuation. This paper proposes a new control method intended for reducing both negative-sequence current and dc-voltage fluctuation to acceptable levels. A laboratory system rated at 200 V and 20 kW confirms the validity of the control method. In addition, this paper addresses the issue of magnetic saturation in the 16 three-phase transformers
  • Keywords
    invertors; load regulation; power control; power transformers; 20 kW; 200 V; BTB system; converter-cells; dc-capacitor voltage fluctuation; magnetic saturation; multilevel converter; negative-sequence current; power flow control; single-line-to-ground fault condition; supply current; supply voltage; three-phase transformers; Control systems; Current supplies; Delay effects; Fluctuations; Laboratories; Load flow control; Power system dynamics; Power system reliability; Saturation magnetization; Voltage; BTB system; multi-level converter; negative-sequence current; power flow control; single-line-to-ground fault;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    0197-2618
  • Print_ISBN
    1-4244-0364-2
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2006.256647
  • Filename
    4025333