Title :
JTAG system test in a MicroTCA world
Author :
Van Treuren, Bradford G. ; Ley, Adam
Author_Institution :
Alcatel-Lucent, Murray Hill, NJ
Abstract :
The telecommunications industry has developed new system architectures through the PCI Industrial Computer Manufacturers Group (PICMG) organization. These are the Advanced Telecom Computing Architecture (ATCA) platforms that consist of the ATCA, ATCA300, Advanced Mezzanine Card (AMC), and MicroTCA specifications. Unfortunately, only the AMC and MicroTCA specification directly addresses testability using an IEEE Std 1149.1 (JTAG) compatible interface. This paper will address the system test facility specified in the MicroTCA specification for testing the incorporated AMC modules as well as the MicroTCA Carrier Hub (MCH) controllers. Access to the individual AMC JTAG chains is provided using a JTAG Switch Module that provides a programmable star architecture in the system.
Keywords :
telecommunication computing; telecommunication network management; IEEE Std 1149.1; JTAG system test; MicroTCA Carrier Hub controllers; MicroTCA world; programmable star architecture; telecommunications industry; testability; Communication industry; Computer aided manufacturing; Computer architecture; Computer industry; Control systems; Manufacturing industries; Switches; System testing; Telecommunication computing; Test facilities;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437657
