• DocumentCode
    2853884
  • Title

    Protocol requirements in an SJTAG/IJTAG environment

  • Author

    Carlsson, Gunnar ; Holmqvist, Johan ; Larsson, Erik

  • Author_Institution
    Ericsson AB, Stockholm
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Integrated circuits, printed circuits boards, and multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/ IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.
  • Keywords
    boundary scan testing; field programmable gate arrays; integrated circuit testing; printed circuit testing; protocols; FPGA; IJTAG environment; STAPL; boundary scan standard; devices-under-test; embedded on-chip instruments; integrated circuits; internal joint test access group; multiboard systems; printed circuits boards; protocol requirements; standard test-and-programming language; system JTAG; system test manager; system-level test management; test controller; Access protocols; Circuit testing; Communication standards; Computer languages; Field programmable gate arrays; Instruments; Integrated circuit testing; Printed circuits; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437658
  • Filename
    4437658