DocumentCode
2853928
Title
Design of an Impulse Commutation Bridge for the Solid-State Transfer Switch
Author
Cheng, Po-Tai ; Chen, Yu-Hsing
Author_Institution
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu
Volume
2
fYear
2006
fDate
8-12 Oct. 2006
Firstpage
1024
Lastpage
1031
Abstract
Voltage sags have become a very critical power quality issue in recent years. Especially in the high-tech industry parks of Taiwan, manufacturers can lose up to a million US dollars for each voltage sag events. Some utility companies provide dual power feeders to these high-tech manufacturers to enhance power quality and reliability. The solid-state transfer switch (STS) based on thyristors can thus utilize the dual power feeders to protect sensitive loads against voltage sags. Conventional STS often require more than quarter cycle to complete the transfer process because its commutation is load dependent. An improved STS with impulse commutated circuit (ICSTS) can greatly reduce the transfer time and provide better ride-through capability against voltage sags. In this paper, an impulse commutation bridge STS (ICBSTS) system is proposed to further reduce the number of the passive components required for forced-commutation. This paper will also discuss the in-rush phenomenon of the transformer due to the line transfer. A flux estimator is developed with the ICBSTS system to reduce the inrush current
Keywords
commutation; power transformers; pulsed power switches; thyristor applications; ICBSTS; Taiwan; dual power feeders; flux estimator; impulse commutated circuit; impulse commutation bridge STS; in-rush current; power quality; power reliability; solid-state transfer switch; thyristors; voltage sag events; Bridge circuits; Manufacturing industries; Power quality; Power system stability; Protection; Sociotechnical systems; Solid state circuits; Switches; Thyristors; Voltage fluctuations; flux estimator; impulse commutation bridge STS; in-rush current; power quality; solid-state transfer switch; voltage sag;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location
Tampa, FL
ISSN
0197-2618
Print_ISBN
1-4244-0364-2
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/IAS.2006.256650
Filename
4025336
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