• DocumentCode
    2853928
  • Title

    Design of an Impulse Commutation Bridge for the Solid-State Transfer Switch

  • Author

    Cheng, Po-Tai ; Chen, Yu-Hsing

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu
  • Volume
    2
  • fYear
    2006
  • fDate
    8-12 Oct. 2006
  • Firstpage
    1024
  • Lastpage
    1031
  • Abstract
    Voltage sags have become a very critical power quality issue in recent years. Especially in the high-tech industry parks of Taiwan, manufacturers can lose up to a million US dollars for each voltage sag events. Some utility companies provide dual power feeders to these high-tech manufacturers to enhance power quality and reliability. The solid-state transfer switch (STS) based on thyristors can thus utilize the dual power feeders to protect sensitive loads against voltage sags. Conventional STS often require more than quarter cycle to complete the transfer process because its commutation is load dependent. An improved STS with impulse commutated circuit (ICSTS) can greatly reduce the transfer time and provide better ride-through capability against voltage sags. In this paper, an impulse commutation bridge STS (ICBSTS) system is proposed to further reduce the number of the passive components required for forced-commutation. This paper will also discuss the in-rush phenomenon of the transformer due to the line transfer. A flux estimator is developed with the ICBSTS system to reduce the inrush current
  • Keywords
    commutation; power transformers; pulsed power switches; thyristor applications; ICBSTS; Taiwan; dual power feeders; flux estimator; impulse commutated circuit; impulse commutation bridge STS; in-rush current; power quality; power reliability; solid-state transfer switch; thyristors; voltage sag events; Bridge circuits; Manufacturing industries; Power quality; Power system stability; Protection; Sociotechnical systems; Solid state circuits; Switches; Thyristors; Voltage fluctuations; flux estimator; impulse commutation bridge STS; in-rush current; power quality; solid-state transfer switch; voltage sag;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    0197-2618
  • Print_ISBN
    1-4244-0364-2
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2006.256650
  • Filename
    4025336