Title :
Cost effective manufacturing test using mission mode tests
Author :
Aggarwal, Parmod
Author_Institution :
Sun Microsyst. Inc., Santa Clara, CA
Abstract :
Mission mode testing, using application level tests on the top of end-customer operating environment, provides a cost effective complement to other tests during manufacturing test of high quality computer systems. It offers unique benefits which are not available with other types of tests. This paper discusses our experience with using Mission Mode tests, their effectiveness and costs, during manufacturing at Sun.
Keywords :
built-in self test; integrated circuit testing; logic testing; microprocessor chips; OS level test; application level tests; built-in self-test; cost effective manufacturing test; diagnostic test; end-customer operating environment; high quality computer systems; in-system test; mission mode testing; native processor test; online test; platform test; Acoustic testing; Application software; Automatic testing; Circuit testing; Costs; Hardware; Operating systems; Pulp manufacturing; Sun; System testing; ATE; BIST; Diagnostic-test; In-System Test; Mission Mode Test; Native Processor Test; OS level Test; Online Test; POST; Platform Test; System Test; Validation;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437662
