DocumentCode
2854022
Title
At-speed structural test: Getting more real every day
Author
Butler, K.M.
Author_Institution
Texas Instrum. Inc., Dallas, TX
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
1
Abstract
The panel deals with the question of whether or not it is possible to rely solely on structural test techniques to fully test an integrated circuit (IC). The position of the author is that it is not only possible, but that the proportion of test content occupied by functional/application patterns is continuing to decrease over time.
Keywords
integrated circuit testing; at-speed structural test techniques; integrated circuit testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Type
conf
DOI
10.1109/TEST.2007.4437668
Filename
4437668
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