Title :
Boundary-scan: Built to last? Panel synopsis
Author_Institution :
Cisco Syst. Inc., San Jose, CA
Abstract :
The IEEE 1149.1 standard has been a workhorse for the board test community. The authors of the standard had tremendous foresight into a problem (test point access) that was not significant at the time but became "critical" over the next several years. Now, more than 15 years later, 1149.1 is still used extensively. However, the nature of the circuits that are being tested is changing rapidly and significantly. Will a similar "foresight" be needed to address the test access issues of the future?
Keywords :
IEEE standards; boundary scan testing; IEEE 1149.1 standard; boundary-scan testing;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437673
