• DocumentCode
    2854113
  • Title

    JTAG: Is it still up to snuff?

  • Author

    Crouch, A.L.

  • Author_Institution
    Inovys Corp., Austin, TX
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Given the advancement in board-level science, and the changes in board-level test requirements; and the fact that the 1149.1 TAP is more being used for "in-chip" control than for static interconnect testing, but with inadequate sequences and bandwidth capability; and given that other standards are being developed to replace some of the missing or inadequate functionality - the question has been asked, "Is the original 1149.1 standard irrelevant, outdated, outmoded, or redundant?"
  • Keywords
    integrated circuit interconnections; JTAG; static interconnect testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437674
  • Filename
    4437674
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2854113