DocumentCode :
2854113
Title :
JTAG: Is it still up to snuff?
Author :
Crouch, A.L.
Author_Institution :
Inovys Corp., Austin, TX
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
1
Abstract :
Given the advancement in board-level science, and the changes in board-level test requirements; and the fact that the 1149.1 TAP is more being used for "in-chip" control than for static interconnect testing, but with inadequate sequences and bandwidth capability; and given that other standards are being developed to replace some of the missing or inadequate functionality - the question has been asked, "Is the original 1149.1 standard irrelevant, outdated, outmoded, or redundant?"
Keywords :
integrated circuit interconnections; JTAG; static interconnect testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Type :
conf
DOI :
10.1109/TEST.2007.4437674
Filename :
4437674
Link To Document :
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