DocumentCode :
2854129
Title :
Boundary-scan: Built to last? panel position
Author :
Nejedlo, J.
Author_Institution :
Intel, Hillsboro, OR
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
2
Abstract :
IEEE 1149.1 standard has been used extensively by the board test community to date. However, the nature of the circuits that are being tested is changing rapidly and significantly. In light of these changes and others the boundary scan technology will not likely survive long term. Higher levels of integration in silicon devices, increases in board density, and platform performance constraints will also play a role. Finally, the ever increasing customer quality expectations (at lower costs, by the way) will likely add nails to the coffin as well. That all being said some limited usage is expected to continue on lower density PCB´s and non-performance critical 10 interfaces for some time yet.
Keywords :
boundary scan testing; printed circuit testing; IEEE 1149.1 standard; board density; board test; boundary scan technology; circuit test; platform performance constraints;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Type :
conf
DOI :
10.1109/TEST.2007.4437675
Filename :
4437675
Link To Document :
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