Title :
Is IEEE Std 1149.1 running out of gas? No way!
Author_Institution :
Agilent Technol., Loveland, CO
Abstract :
Boundary-scan was always intended to be used for loaded board testing, to help find manufacturing defects at the board level such as shorted nets, opens solder joints, missing devices, etc. And yet, it has been firmly grasped by IC designers as a gateway to solving IC testing problems as well.
Keywords :
IEEE standards; boundary scan testing; integrated circuit testing; IEEE 1149.1 standard; boundary-scan test; integrated circuit testing; loaded board testing; manufacturing defects;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437676
