• DocumentCode
    2854177
  • Title

    A silicon validation and debug solution with great benefits and low costs

  • Author

    Abramovici, M.

  • Author_Institution
    DAFCA, Inc., Framingham, MA
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Pre-silicon, an instrumentation tool automates the insertion of compact reconfigurable instruments at RTL, and the instrumented SoC is processed by standard synthesis-based design flows. The instrumentation creates an infrastructure platform that is dynamically configured, operated, and controlled by the post-silicon validation and debug tool.
  • Keywords
    electron device testing; product development; system-on-chip; debug tool; instrumentation tool; silicon validation; system-on-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437679
  • Filename
    4437679
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2854177