• DocumentCode
    2854244
  • Title

    Thermosonic gold wire bonding to palladium finishes on laminate substrates

  • Author

    Johnson, R. Wayne ; Palmer, Michael ; Bozack, Mike ; Isaacs-Smith, Tamara

  • Author_Institution
    Dept. of Electr. Eng., Auburn Univ., AL, USA
  • fYear
    1998
  • fDate
    15-17 Apr 1998
  • Firstpage
    291
  • Lastpage
    299
  • Abstract
    As the laminate substrate industry moves from hot air solder level (HASL) finishes, alternate plating finishes are being proposed, such as immersion gold/electroless nickel, electroless palladium and electroless silver. This paper presents results of an evaluation of the thermosonic gold ball wire bondability of electroless palladium. Two palladium thicknesses, with and without a nickel underlayer, from two vendors were evaluated. In each case, a thin gold passivation layer was deposited by immersion plating over the palladium. The initial evaluation criteria included bondability (number of missed bonds and flame-off errors), wire pull strength, standard deviation, bond failure mode and visual inspection. The bonding window was determined by independently varying force (4 levels), power (4 levels) and time (2 levels). The stage temperature was maintained at 150°C, compatible with BT laminate material. The effects of different preconditioning environments such as a solder reflow cycle, high temperature storage (125°C) and humidity storage (85% RH/85°C) on initial bondability were also considered. Rutherford backscattering and Auger analysis were used to examine the surface finishes. The stability of the bonds was investigated by high temperature storage (125°C) with periodic electrical resistance and pull strength testing
  • Keywords
    Auger effect; Rutherford backscattering; electric resistance; electroless deposited coatings; failure analysis; gold; humidity; inspection; laminates; lead bonding; mechanical testing; metallisation; packaging; palladium; passivation; reflow soldering; stability; surface treatment; 125 C; 150 C; 85 C; Au-Pd; Au-Pd-Ni; Auger analysis; BT laminate material; Rutherford backscattering; bond failure mode; bond stability; bondability; bonding window; electrical resistance testing; electroless palladium; electroless silver; flame-off errors; high temperature storage; hot air solder level finishes; humidity storage; immersion gold/electroless nickel; immersion plating; laminate substrate; laminate substrates; missed bonds; nickel underlayer; palladium finishes; palladium thickness; plating finishes; preconditioning environments; pull strength testing; solder reflow cycle; stage temperature; standard deviation; surface finishes; thermosonic gold ball wire bondability; thermosonic gold wire bonding; thin gold passivation layer; visual inspection; wire pull strength; Bonding; Gold; Inspection; Laminates; Nickel; Palladium; Passivation; Silver; Temperature; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules and High Density Packaging, 1998. Proceedings. 1998 International Conference on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-4850-8
  • Type

    conf

  • DOI
    10.1109/ICMCM.1998.670796
  • Filename
    670796