DocumentCode
2854254
Title
How can the results of silicon debug justify the investment in design-for- debug infrastructure?
Author
Gottlieb, Bob
Author_Institution
Intel Corporation, 2200 Mission College Blvd, Santa Clara, CA 95052, USA
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
1
Abstract
With the increase in clock domains and multicore designs, the impact of adding traditional debug features is becoming prohibitive.. The impact is mainly in restrictions in device operation and increased risk to the design itself. It is no longer a given that these features pay for themselves in terms of benefit to silicon debug and test.
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Type
conf
DOI
10.1109/TEST.2007.4437682
Filename
4437682
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