DocumentCode :
2854254
Title :
How can the results of silicon debug justify the investment in design-for- debug infrastructure?
Author :
Gottlieb, Bob
Author_Institution :
Intel Corporation, 2200 Mission College Blvd, Santa Clara, CA 95052, USA
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
1
Abstract :
With the increase in clock domains and multicore designs, the impact of adding traditional debug features is becoming prohibitive.. The impact is mainly in restrictions in device operation and increased risk to the design itself. It is no longer a given that these features pay for themselves in terms of benefit to silicon debug and test.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Type :
conf
DOI :
10.1109/TEST.2007.4437682
Filename :
4437682
Link To Document :
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