• DocumentCode
    2854254
  • Title

    How can the results of silicon debug justify the investment in design-for- debug infrastructure?

  • Author

    Gottlieb, Bob

  • Author_Institution
    Intel Corporation, 2200 Mission College Blvd, Santa Clara, CA 95052, USA
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    With the increase in clock domains and multicore designs, the impact of adding traditional debug features is becoming prohibitive.. The impact is mainly in restrictions in device operation and increased risk to the design itself. It is no longer a given that these features pay for themselves in terms of benefit to silicon debug and test.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437682
  • Filename
    4437682