Does test have a greater role to play in the DFM process?

Test and diagnostics of SRAM vehicles, test chips and products has the potential to provide the feedback to identify and quantify DFM-related issues including both functional yield and parametric issues (power and performance). Does testing have a greater role to play in the DFM process? The scope of tests includes product test, test of test-structures and on-product structures like ring-oscillators. It also includes not just wafer and final tests but also characterization and even field tests. Broadly, it is learning from silicon using tests.