Title :
Well-targeted design-for-manufacturability[DFM] through test
Author_Institution :
Austin Res. Lab., IBM, Austin, TX
Abstract :
In summary, test needs to expand its efforts to guide DFM because of product-test´s inherent coverage of the physical and electrical configurations in the design, inherent reflection of the impact of imperfections on the product, and ability to account for true product quality (DPM) as well as yield.
Keywords :
design for manufacture; integrated circuit design; integrated circuit testing; production testing; DFM; IC testing; design-for-manufacturability; electronic product quality;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
DOI :
10.1109/TEST.2007.4437685
