• DocumentCode
    2854331
  • Title

    The essential role of test in DFM

  • Author

    Walker, D.M.H.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Design for manufacturing (DFM) is essential to achieving competitive yields in deep submicron technologies. The limiting factor in the successful application of DFM is manufacturing data. However, collecting this manufacturing data is increasingly difficult and expensive.
  • Keywords
    design for manufacture; integrated circuit manufacture; integrated circuit testing; manufacturing data processing; deep submicron technology; design for manufacturing; limiting factor; manufacturing data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437687
  • Filename
    4437687
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2854331