Title :
Improved MOSFET surface-wave detectors for monolithic analog signal processors
Author_Institution :
Texas Instruments Inc., Dallas, TX, USA
Abstract :
Improved sensitivity of N-channel MOSFETs will be discussed, citing new matched filter implementation techniques. Successful integration of MOS-LSI and acoustic surface-wave technologies is expected to have a large impact on signal processing in the VHF-UHF frequency range.
Keywords :
Acoustic signal detection; Acoustic waves; Detectors; MOSFET circuits; Piezoresistance; Power MOSFET; Signal processing; Silicon; Surface acoustic waves; Tensile stress;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1972.1155114
