• DocumentCode
    2854442
  • Title

    Enhanced Spectral Embedding with Semi-supervised Feature Selection

  • Author

    Du, Weiwei ; Urahama, Kiichi

  • Author_Institution
    Dept. of Inf. Sci., Kyoto Inst. of Technol., Kyoto, Japan
  • Volume
    1
  • fYear
    2009
  • fDate
    14-16 Aug. 2009
  • Firstpage
    129
  • Lastpage
    133
  • Abstract
    We present a spectral embedding technique for semi-supervised pattern classification. Importance scores of features are firstly evaluated with a semi-supervised feature selection algorithm by Zhao et al. Training data are then embedded into a low-dimensional space with a spectral mapping derived from the selected and weighted feature vectors with which test data are classified by the nearest neighbor rule. The performance of the proposed pattern classification algorithm is examined with synthetic and real datasets.
  • Keywords
    pattern classification; enhanced spectral embedding; low-dimensional space; nearest neighbor rule; semisupervised feature selection; semisupervised pattern classification; spectral mapping; weighted feature vectors; Classification algorithms; Embedded computing; Information science; Laplace equations; Pattern classification; Principal component analysis; Semisupervised learning; Space technology; Testing; Training data; a low-dimensional space with a spectral mapping; semisupervised pattern classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Natural Computation, 2009. ICNC '09. Fifth International Conference on
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-0-7695-3736-8
  • Type

    conf

  • DOI
    10.1109/ICNC.2009.170
  • Filename
    5365606