DocumentCode
2854442
Title
Enhanced Spectral Embedding with Semi-supervised Feature Selection
Author
Du, Weiwei ; Urahama, Kiichi
Author_Institution
Dept. of Inf. Sci., Kyoto Inst. of Technol., Kyoto, Japan
Volume
1
fYear
2009
fDate
14-16 Aug. 2009
Firstpage
129
Lastpage
133
Abstract
We present a spectral embedding technique for semi-supervised pattern classification. Importance scores of features are firstly evaluated with a semi-supervised feature selection algorithm by Zhao et al. Training data are then embedded into a low-dimensional space with a spectral mapping derived from the selected and weighted feature vectors with which test data are classified by the nearest neighbor rule. The performance of the proposed pattern classification algorithm is examined with synthetic and real datasets.
Keywords
pattern classification; enhanced spectral embedding; low-dimensional space; nearest neighbor rule; semisupervised feature selection; semisupervised pattern classification; spectral mapping; weighted feature vectors; Classification algorithms; Embedded computing; Information science; Laplace equations; Pattern classification; Principal component analysis; Semisupervised learning; Space technology; Testing; Training data; a low-dimensional space with a spectral mapping; semisupervised pattern classification;
fLanguage
English
Publisher
ieee
Conference_Titel
Natural Computation, 2009. ICNC '09. Fifth International Conference on
Conference_Location
Tianjin
Print_ISBN
978-0-7695-3736-8
Type
conf
DOI
10.1109/ICNC.2009.170
Filename
5365606
Link To Document