Title :
Enhanced Spectral Embedding with Semi-supervised Feature Selection
Author :
Du, Weiwei ; Urahama, Kiichi
Author_Institution :
Dept. of Inf. Sci., Kyoto Inst. of Technol., Kyoto, Japan
Abstract :
We present a spectral embedding technique for semi-supervised pattern classification. Importance scores of features are firstly evaluated with a semi-supervised feature selection algorithm by Zhao et al. Training data are then embedded into a low-dimensional space with a spectral mapping derived from the selected and weighted feature vectors with which test data are classified by the nearest neighbor rule. The performance of the proposed pattern classification algorithm is examined with synthetic and real datasets.
Keywords :
pattern classification; enhanced spectral embedding; low-dimensional space; nearest neighbor rule; semisupervised feature selection; semisupervised pattern classification; spectral mapping; weighted feature vectors; Classification algorithms; Embedded computing; Information science; Laplace equations; Pattern classification; Principal component analysis; Semisupervised learning; Space technology; Testing; Training data; a low-dimensional space with a spectral mapping; semisupervised pattern classification;
Conference_Titel :
Natural Computation, 2009. ICNC '09. Fifth International Conference on
Conference_Location :
Tianjin
Print_ISBN :
978-0-7695-3736-8
DOI :
10.1109/ICNC.2009.170