• DocumentCode
    2854461
  • Title

    Where is car IC testing going?

  • Author

    Comen, Steve

  • Author_Institution
    Texas Instrum., Inc., Dallas, TX
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Car ICs will continue to increase in complexity and integration. Test must evolve to maintain quality while not allowing test cost to increase as a percent of the overall cost of the product. Better design for test methods and more focus on DFT will be required to achieve this goal.
  • Keywords
    automotive electronics; design for testability; integrated circuit design; integrated circuit testing; car IC testing; design for test; quality maintenance; Automotive engineering; Cost function; Design for testability; Design methodology; Driver circuits; Instruments; Integrated circuit testing; Logic testing; Product design; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437696
  • Filename
    4437696
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2854461