DocumentCode
2854474
Title
A low-light-level self-scanned MOS image sensor
Author
Plummer, James ; Meindl, J.
Author_Institution
Stanford Univ., Stanford, Cal., USA
Volume
XV
fYear
1972
fDate
16-18 Feb. 1972
Firstpage
30
Lastpage
31
Abstract
A low-light-level self-scanned MOS image sensor using new signal processing and scanning techniques to eliminate completely switching transient noise from the array output has been developed.
Keywords
Automatic testing; Circuit testing; Image sensors; Lighting; Optical arrays; Registers; Retina; Sensor arrays; Switches; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1972 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1972.1155120
Filename
1155120
Link To Document