Title :
How to ensure zero defects from the beginning with semiconductor test methods
Author_Institution :
austriamicrosystems AG, Graz
Abstract :
Today, reliability of electronic products is considered as the minimum requirement to ensure the functionality in a safe and reliable way over years. From the semiconductor sector, as the provider from high-integrated circuits, this trend, is one of the main challenges to ensure the reliability of the product, but much more to precisely predict the reliability of those products. austriamicrosystems very early recognized this trend and implemented the zero-defect program over all process steps from design to the end-of-the-life their product. In this paper an overview of the zero-defect program the achievements and the methods are described is shown.
Keywords :
electronic products; integrated circuit design; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; quality assurance; austriamicrosystems; electronic product reliability; integrated circuit design; quality assurance; semiconductor test methods; zero-defect program; Area measurement; Electronic equipment testing; Integrated circuit reliability; Manufacturing; Product design; Production; Quality assurance; Semiconductor device reliability; Semiconductor device testing; Space exploration;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437697
