DocumentCode
2854485
Title
Car IC test changing but the same quality goal
Author
Wittie, Gary
Author_Institution
Freescale Semicond. Inc., Austin, TX
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
1
Abstract
No matter how the auto IC industry evolves with the standards organizations and consortiums, the semiconductor suppliers must still meet the zero-defect quality requirement imposed by the automotive industry.
Keywords
automobile industry; integrated circuit manufacture; integrated circuit testing; auto IC industry; automotive industry; car IC test; semiconductor suppliers; zero-defect quality; Automotive engineering; Best practices; Design for manufacture; Design for testability; Integrated circuit testing; Manufacturing industries; Manufacturing processes; Semiconductor device manufacture; Semiconductor device testing; Standards organizations;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2007.4437698
Filename
4437698
Link To Document