DocumentCode
2854529
Title
A universal DC to logic performance correlation
Author
Marshall, Andrew
Author_Institution
Texas Instrum. Inc., Dallas, TX
fYear
2007
fDate
21-26 Oct. 2007
Firstpage
1
Lastpage
4
Abstract
A correlation of DC component and circuit characteristics to logic path performance is presented which is more accurate than previous correlations, and permits a predictive assessment of performance over multiple process nodes, given a limited set of DC component values.
Keywords
logic gates; logic testing; NAND gates; logic speed performance; logic testing; predictive assessment; universal DC component; Delay; Frequency; Inverters; Logic circuits; Logic gates; Logic testing; MOS devices; Ring oscillators; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-1127-6
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2007.4437701
Filename
4437701
Link To Document