• DocumentCode
    2854563
  • Title

    Position Error Inspection for Mounting Wafer in Cleaning Device

  • Author

    Jung Woo Lee ; Liliana ; Lee, Joon-Jae ; Joon-Jae Lee

  • Author_Institution
    Div. of Comput. Inf. Eng., Dongseo Univ., Busan
  • fYear
    2008
  • fDate
    26-28 Aug. 2008
  • Firstpage
    280
  • Lastpage
    285
  • Abstract
    Recently, many inspection systems are using computer vision technology. We also use computer vision to recognize the position error for mounting a wafer in a cleaning process of the semiconductor production processes. The robot moves wafer to the cleaning chamber. But sometime, the robot puts the wafer into an incorrect location. In this case, incorrect position becomes cause of the cleaning system trouble or the wafer´s broken. In this paper, we propose a position error recognition system using multiple cameras based on Giga Ethernet in multi-cleaning system. This is carried out by capturing image by high frame rate, followed by doing calibration and image processing to check the wafer´s position before the cleaning process starts. If the robot puts the wafer in the incorrect location, the machine stops the cleaning process. So, we can prevent the wafer from being broken or the machine from being disturbing the cleaning process.
  • Keywords
    automatic optical inspection; cleaning; computer vision; integrated circuit manufacture; production engineering computing; Giga Ethernet; cleaning device; cleaning process; computer vision technology; inspection systems; multicleaning system; position error inspection; position error recognition system; semiconductor production processes; wafer mounting; Calibration; Cameras; Cleaning; Computer errors; Computer vision; Ethernet networks; Image processing; Inspection; Production; Robot vision systems; Calibration; Image Processing; Recognition; Wafer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Graphics, Imaging and Visualisation, 2008. CGIV '08. Fifth International Conference on
  • Conference_Location
    Penang
  • Print_ISBN
    978-0-7695-3359-9
  • Type

    conf

  • DOI
    10.1109/CGIV.2008.23
  • Filename
    4627020