Title :
Charge injection imaging
Author :
Michon, G. ; Burke, H.
Author_Institution :
General Electric Co., Schenectady, NY, USA
Keywords :
Drives; Electrodes; Image sensors; Image storage; Interference; MOS capacitors; Parasitic capacitance; Sensor arrays; Silicon; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1973.1155135
