• DocumentCode
    2854719
  • Title

    Online estimation of an electric vehicle Lithium-Ion battery using recursive least squares with forgetting

  • Author

    Hu Xiaosong ; Sun Fengchun ; Zou Yuan ; Peng Huei

  • Author_Institution
    Dept. of Mech. & Vehicular Eng., Beijing Inst. of Technol., Beijing, China
  • fYear
    2011
  • fDate
    June 29 2011-July 1 2011
  • Firstpage
    935
  • Lastpage
    940
  • Abstract
    A battery model that is suitable for real-time State-of-Charge (SOC) estimation of a Lithium-Ion battery is presented in this paper. The battery open circuit voltage (OCV) as a function of SOC is described by an adaptation of the Nernst equation. The analytical representation can facilitate Kalman filtering or observer-based SOC estimation methods. A zero-state hysteresis correction term is used to depict the hysteresis effect of the battery. A parallel resistance-capacitance (RC) network is used to depict the relaxation effect of the battery. A linear discrete-time formulation of the battery model is derived. A recursive least squares algorithm with forgetting is applied to implement the online parameter calibration. Validation results show that the calibrated model can accurately simulate the dynamic voltage behavior of the Lithium-Ion battery for two different experimental data sets.
  • Keywords
    Kalman filters; battery powered vehicles; least squares approximations; lithium; recursive estimation; secondary cells; Kalman filtering; Nernst equation; OCV; battery model; battery open circuit voltage; battery relaxation effect; electric vehicle lithium-ion battery; linear discrete-time formulation; lithium-ion battery; observer-based SOC estimation methods; online estimation; online parameter calibration; parallel RC network; parallel resistance-capacitance network; real-time SOC estimation; real-time state-of-charge estimation; recursive least squares; zero-state hysteresis correction term; Batteries; Battery charge measurement; Integrated circuit modeling; Mathematical model; System-on-a-chip; Transient analysis; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2011
  • Conference_Location
    San Francisco, CA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4577-0080-4
  • Type

    conf

  • DOI
    10.1109/ACC.2011.5991260
  • Filename
    5991260