Title :
Comparison of Surface Scattering Models for Gaussian and Exponential Surfaces
Author :
Darawankul, Alongkorn ; Johnson, Joel T. ; Chen, K.S.
Author_Institution :
Dept. of Electr. Eng. & ElectroSci. Lab., Ohio State Univ., Columbus, OH
fDate :
July 31 2006-Aug. 4 2006
Abstract :
In this paper, predictions from the small-slope approximation (SSA), the advanced integral equation model (AIEM), and the reduced third-order local curvature approximation (RLCA3) theories of rough surface scattering are compared with each other and with predictions obtained from numerical simulations for dielectric surfaces with Gaussian and exponential correlation functions. A discussion of the results obtained is provided, along with plans for continued investigations.
Keywords :
Gaussian distribution; exponential distribution; numerical analysis; remote sensing; scattering; terrestrial electricity; AIEM; Advanced Integral Equation Model; Gaussian correlation function; RLCA3 theories; Reduced third-order Local Curvature Approximation; dielectric surfaces; exponential correlation functions; numerical simulations; perturbation method; remote sensing; rough surface scattering; small-slope approximation; surface scattering models; Integral equations; Optical scattering; Optical surface waves; Predictive models; Radar scattering; Remote sensing; Rough surfaces; Scanning probe microscopy; Sea surface; Surface roughness;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2006. IGARSS 2006. IEEE International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-9510-7
DOI :
10.1109/IGARSS.2006.267
