An 8-k bit random-access memory chip using a one-device FET cell

Author

Hoffman, W. ; Kalter

Author_Institution

IBM Corp., Essex Junction, VT, USA

Volume

XVI

fYear

1973

fDate

14-16 Feb. 1973

Firstpage

Lastpage

Keywords

Chip scale packaging; Decoding; Driver circuits; FETs; Geometry; Inverters; Laboratories; Minimization; Productivity; Registers;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

DOI

10.1109/ISSCC.1973.1155147

Filename

1155147

Link To Document