Title :
An 8-k bit random-access memory chip using a one-device FET cell
Author :
Hoffman, W. ; Kalter
Author_Institution :
IBM Corp., Essex Junction, VT, USA
Keywords :
Chip scale packaging; Decoding; Driver circuits; FETs; Geometry; Inverters; Laboratories; Minimization; Productivity; Registers;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1973.1155147
