DocumentCode
2854887
Title
The critical path for multiple faults
Author
Makar, S. ; McCluskey, E.
Author_Institution
Center for Reliable Comput., Stanford Univ., CA, USA
fYear
1989
fDate
5-9 Nov. 1989
Firstpage
162
Lastpage
165
Abstract
The critical path technique for determining the single stuck-at faults detected by a test is extended to multiple faults by defining masking paths. A masking tree is used to represent the masking relationships among individual faults. These relationships are then used to determine which multiple faults are actually detected by a test.<>
Keywords
fault location; logic testing; trees (mathematics); critical path; logic testing; masking paths; masking tree; multiple faults; stuck-at faults; Circuit faults; Circuit simulation; Circuit testing; Computer science; Electrical fault detection; Fault detection; Laboratories; Manufacturing; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1989. ICCAD-89. Digest of Technical Papers., 1989 IEEE International Conference on
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-8186-1986-4
Type
conf
DOI
10.1109/ICCAD.1989.76927
Filename
76927
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