DocumentCode
2854979
Title
The elimination of tuning-induced burnout and bias circuit oscillations in IMPATT oscillators
Author
Brackett, C.
Author_Institution
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Volume
XVI
fYear
1973
fDate
14-16 Feb. 1973
Firstpage
114
Lastpage
115
Abstract
The physical origins, equivalent circuit, experimental characterization and the principles and techniques for the stabilization of bias circuit instabilities in IMPATT oscillators will be discussed.
Keywords
Circuit noise; Current measurement; Diodes; Gallium arsenide; Impedance; Low-frequency noise; Microwave circuits; Oscillators; Radio frequency; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1973.1155154
Filename
1155154
Link To Document