• DocumentCode
    2855038
  • Title

    Characterization of charge-coupled device line and area-array imaging at low light levels

  • Author

    White, M. ; Lampe, D. ; Mack, I. ; Blaha, F.

  • Author_Institution
    Westinghouse Electric Corp., Baltimore, MD, USA
  • Volume
    XVI
  • fYear
    1973
  • fDate
    14-16 Feb. 1973
  • Firstpage
    134
  • Lastpage
    135
  • Abstract
    A cell design affording compacting of an active CCD sensor, interline shift sensor, transfer gate and stopper diffusion into 2-mil centers with 5-m aluminum lines and spacings in a 75 × 100 element array will be described. Coherent readout technique removes Nyquist noise and suppresses clock feedthroughs.
  • Keywords
    Charge coupled devices; Circuit noise; Clamps; Delay lines; Dynamic range; Noise generators; Optical coupling; Semiconductor device noise; Silicon; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1973.1155159
  • Filename
    1155159
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2855038