• DocumentCode
    2855083
  • Title

    Power MOSFET Switching Loss Analysis: A New Insight

  • Author

    Shen, Z. John ; Xiong, Yali ; Cheng, Xu ; Fu, Yue ; Kumar, Pavan

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Central Florida Univ., Orlando, FL
  • Volume
    3
  • fYear
    2006
  • fDate
    8-12 Oct. 2006
  • Firstpage
    1438
  • Lastpage
    1442
  • Abstract
    Realistic estimation of power MOSFET switching losses is critical for predicting the maximum junction temperature and efficiency of power electronics circuits. The purpose of this paper is to investigate the internal physics of MOSFET switching processes using a physically based semiconductor device modeling approach, and subsequently examine the commonly used power loss calculation method based on the new physical insights. The widely accepted output capacitance loss term in this calculation method is found to be redundant and erroneous. In addition, the current method of approximating switching times with power MOSFET gate charge parameters grossly overestimates the switching power loss. This paper recommends a new MOSFET gate charge parameter specification and an effective switching time estimation method to compensate for the power loss calculation error introduced by the two slope voltage transition waveform of the power MOSFET
  • Keywords
    losses; power MOSFET; power semiconductor switches; semiconductor device models; switching convertors; gate charge parameter specification; power MOSFET; power loss calculation error; power loss calculation method; semiconductor device modeling; switching power loss; switching time estimation method; two slope voltage transition waveform; Capacitance; MOSFET circuits; Physics; Power MOSFET; Power electronics; Power semiconductor switches; Semiconductor device modeling; Switching loss; Temperature; Voltage; Power MOSFET; power converters; switching power loss;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    0197-2618
  • Print_ISBN
    1-4244-0364-2
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2006.256719
  • Filename
    4025406