Title :
Exploration of Power Device Reliability using Compact Device Models and Fast Electro-Thermal Simulation
Author :
Bryant, A.T. ; Mawby, P.A. ; Palmer, P.R. ; Santi, E. ; Hudgins, J.L.
Author_Institution :
Sch. of Eng., Warwick Univ.
Abstract :
This paper presents the application of compact IGBT and PIN diode models, including features such as local lifetime control and field-stop technology, to the full electrothermal system simulation of a hybrid electric vehicle converter using a lookup table of device losses. The vehicle converter is simulated with an urban driving cycle (FUDS), used to generate transient device temperature profiles. A methodology is also described to explore the converter reliability using the temperature profile, with techniques from materials fatigue analysis. The effects of ambient temperature, driving style and converter design on converter reliability are also investigated
Keywords :
automotive electronics; insulated gate bipolar transistors; p-i-n diodes; power semiconductor devices; semiconductor device models; semiconductor device reliability; thermal stress cracking; PIN diode models; compact IGBT models; compact device models; device losses; electrothermal system simulation; field-stop technology; hybrid electric vehicle converter; local lifetime control; lookup table; materials fatigue analysis; power device reliability; power semiconductor devices; temperature profile; thermal cycling; urban driving cycle; Electrothermal effects; Fatigue; Hybrid electric vehicles; Insulated gate bipolar transistors; Materials reliability; Power system modeling; Power system reliability; Table lookup; Temperature; Vehicle driving; Reliability; compact modeling; electro-thermal simulation; mission profile; power semiconductor devices; rainflow cycle counting; thermal cycling;
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
DOI :
10.1109/IAS.2006.256723
