• DocumentCode
    2855262
  • Title

    Design of sub-90 nm circuits and design methodologies

  • Author

    Devgan, Anirudh ; Puri, Ruchir ; Sapatnaker, Sachin ; Karnik, Tanay ; Joshi, Rajiv

  • Author_Institution
    IBM Res., Austin, TX, USA
  • fYear
    2005
  • fDate
    21-23 March 2005
  • Firstpage
    5
  • Lastpage
    6
  • Abstract
    Summary form only given. The tutorial discusses the design challenges of scaled CMOS circuits in sub-90 nm technologies and the design methodologies required in order to produce robust designs with the desired power-performance trade-off. We focus on four major components: design challenges of sub-90 nm CMOS circuits with particular emphasis on the implications of each individual device scaling element on circuit design; design methodologies for implementing robust circuits with desired power performance characteristics; managing leakage power; circuit design in the presence of uncertainty.
  • Keywords
    CMOS integrated circuits; design engineering; integrated circuit design; nanoelectronics; circuit design methodologies; device scaling element; leakage power; power-performance trade-off; robust designs; scaled CMOS circuits; uncertainty; CMOS technology; Circuit synthesis; Delay; Design engineering; Design methodology; Integrated circuit interconnections; Robustness; Routing; Space technology; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
  • Print_ISBN
    0-7695-2301-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2005.45
  • Filename
    1410546