DocumentCode :
2855296
Title :
Modeling and design of chip-package interface
Author :
Devgan, Anirudh ; Daniel, Luca ; Krauter, Byron ; He, Lei
Author_Institution :
IBM Res., Austin, TX, USA
fYear :
2005
fDate :
21-23 March 2005
Firstpage :
6
Abstract :
Summary form only given. Signal integrity (SI) and power integrity are forecast to be paramount issues for future chip and package designs. Larger numbers of IOs, higher frequencies, and tighter noise margins necessitate the merging of the design paradigms for chip IO and package. We shed light on a new chip-package codesign paradigm and all the technologies necessary to enable it. We first discuss parameterized reduced order models accounting for all high frequency SI effects in the package that can be reliably and automatically extracted by field solvers. We then introduce package-aware chip IO planning and placement, which is the key to chip-packaging codesign. Finally, we cover detailed power and signal integrity modeling and optimization in package.
Keywords :
integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; random noise; semiconductor device noise; chip IO; chip-package codesign; chip-package interface design; chip-package interface modeling; field solvers; noise margins; optimization; package-aware chip IO placement; package-aware chip IO planning; parameterized reduced order models; power integrity; signal integrity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
Type :
conf
DOI :
10.1109/ISQED.2005.78
Filename :
1410547
Link To Document :
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