• DocumentCode
    2855296
  • Title

    Modeling and design of chip-package interface

  • Author

    Devgan, Anirudh ; Daniel, Luca ; Krauter, Byron ; He, Lei

  • Author_Institution
    IBM Res., Austin, TX, USA
  • fYear
    2005
  • fDate
    21-23 March 2005
  • Firstpage
    6
  • Abstract
    Summary form only given. Signal integrity (SI) and power integrity are forecast to be paramount issues for future chip and package designs. Larger numbers of IOs, higher frequencies, and tighter noise margins necessitate the merging of the design paradigms for chip IO and package. We shed light on a new chip-package codesign paradigm and all the technologies necessary to enable it. We first discuss parameterized reduced order models accounting for all high frequency SI effects in the package that can be reliably and automatically extracted by field solvers. We then introduce package-aware chip IO planning and placement, which is the key to chip-packaging codesign. Finally, we cover detailed power and signal integrity modeling and optimization in package.
  • Keywords
    integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; random noise; semiconductor device noise; chip IO; chip-package codesign; chip-package interface design; chip-package interface modeling; field solvers; noise margins; optimization; package-aware chip IO placement; package-aware chip IO planning; parameterized reduced order models; power integrity; signal integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
  • Print_ISBN
    0-7695-2301-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2005.78
  • Filename
    1410547