Title :
A Prognostic and Warning System for Power Electronic Modules in Electric, Hybrid, and Fuel Cell Vehicles
Author :
Xiong, Y. ; Cheng, X. ; Shen, Z.J. ; Mi, C. ; Wu, H. ; Garg, V.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Central Florida Univ., Orlando, FL
Abstract :
Reliability of power electronics modules is of paramount importance for the commercial success of various types of electric vehicles. In this paper, we study the technical feasibility of detecting early symptoms and warning signs of power module degradation due to thermomechanical stress and fatigue, and developing a prognostic system that monitors the state of health of the power modules in electric, hybrid, and fuel cell vehicles. A signature degradation trace of the on-voltage of IGBT modules was observed from accelerated power cycling test. This on-voltage "anomaly" can be attributed to sequential events of solder joint degradation followed by wirebond lift-off mechanisms. A quasi real-time IGBT failure prognostic algorithm based on monitoring the abnormal VCEsat variation at specific currents and temperatures is developed. The algorithm was verified using extensive SIMULINK modeling. The prognostic system can be implemented cost-effectively in existing vehicle hardware/software architectures
Keywords :
crack-edge stress field analysis; failure analysis; fault diagnosis; fuel cell vehicles; hybrid electric vehicles; insulated gate bipolar transistors; power semiconductor devices; semiconductor device breakdown; IGBT modules; accelerated power cycling test; electric vehicles; extensive SIMULINK modeling; failure prognostic algorithm; fatigue; fuel cell vehicles; hardware-software architectures; monitoring; power electronic modules; power electronics modules reliability; power module degradation; prognostic system; signature degradation trace; solder joint degradation; thermomechanical stress; warning system; wirebond lift-off mechanisms; Alarm systems; Degradation; Fuel cell vehicles; Hybrid electric vehicles; Insulated gate bipolar transistors; Multichip modules; Power electronics; Power system reliability; Thermomechanical processes; Vehicle detection; electric vehicles; electronics module; hybrid vehicles; reliability;
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
DOI :
10.1109/IAS.2006.256739
