• DocumentCode
    2855488
  • Title

    TFT-LCD application specific low power SRAM using charge-recycling technique

  • Author

    Kee-Jong Kim ; Kim, Chris H. ; Roy, Kaushik

  • Author_Institution
    Sch. of ECE, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2005
  • fDate
    21-23 March 2005
  • Firstpage
    59
  • Lastpage
    64
  • Abstract
    We propose a novel low power charge-recycling SRAM (CR-SRAM) for portable TFT-LCD applications. In portable TFT-LCD applications, low power considerations are becoming more important for longer battery lifetime. To reduce the power consumption in SRAMs, the source-line, connected to the source terminals of the driver MOSFETs, is controlled, so that it is zero in the active mode and has a positive bias voltage in the stand-by mode. However, the overhead power consumed during the control of source-line voltage is considerable due to the large capacitive load on the source-line. Applying a charge-recycling technique to the source-line allows reduction of the power dissipation of the source-biased SRAM. Moreover, by exploiting the sequential access pattern of the TFT-LCD memory, the proposed CR-SRAM can efficiently reduce the power dissipation of the control circuit for charge recycling. The proposed CR-SRAM is implemented in a 0.18 μm technology and shows 68% and 14% power reduction compared to conventional SRAM (CON-SRAM) and source-biased SRAM (SB-SRAM), respectively. We also evaluate the power consumptions under various temperatures and row driver clock frequencies. Experimental results show that the percentage of power savings due to charge recycling increases with the higher frequency and achieved a maximum of 25% at 250 MHz.
  • Keywords
    SRAM chips; integrated circuit design; liquid crystal displays; power consumption; 0.18 micron; 250 MHz; TFT-LCD memory; application specific SRAM; charge-recycling SRAM; clock frequencies; driver MOSFET; low power SRAM; portable TFT-LCD applications; power consumption; sequential access pattern; source-biased SRAM; source-line; Batteries; Circuits; Energy consumption; Frequency; MOSFETs; Power dissipation; Random access memory; Recycling; Temperature; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
  • Print_ISBN
    0-7695-2301-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2005.121
  • Filename
    1410558