• DocumentCode
    2855611
  • Title

    Outlier detection to identify artefacts in EEG signals

  • Author

    Cluitmans, Pierre J M ; Van de Velde, Maarten

  • Author_Institution
    Dept. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2825
  • Abstract
    A method is presented to identify artefacts in clinical EEG recordings. The method is based upon the assumption that artefacts manifest themselves as outliers in one or more EEG-derived parameters. Parameters used are primarily derived from a 5th order autoregressive model, fitted to each subsequent second of EEG data. The method results in a set of threshold detection rules that identify outliers in parameter space. Detection thresholds are derived from an analysis of the experimental cumulative distribution function in a training set of clinical EEG recordings, annotated by a human observer
  • Keywords
    electroencephalography; medical signal detection; 5th order autoregressive model; EEG-derived parameters; artefacts identification; clinical EEG recordings; electrodiagnostics; experimental cumulative distribution function; human observer; neuromonitoring; outlier detection; supervised training; threshold detection rules; training set; Accuracy; Biomedical measurements; Brain modeling; Distribution functions; Electroencephalography; Humans; Impedance; Signal processing; Testing; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-6465-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.2000.901453
  • Filename
    901453