DocumentCode
2855611
Title
Outlier detection to identify artefacts in EEG signals
Author
Cluitmans, Pierre J M ; Van de Velde, Maarten
Author_Institution
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
Volume
4
fYear
2000
fDate
2000
Firstpage
2825
Abstract
A method is presented to identify artefacts in clinical EEG recordings. The method is based upon the assumption that artefacts manifest themselves as outliers in one or more EEG-derived parameters. Parameters used are primarily derived from a 5th order autoregressive model, fitted to each subsequent second of EEG data. The method results in a set of threshold detection rules that identify outliers in parameter space. Detection thresholds are derived from an analysis of the experimental cumulative distribution function in a training set of clinical EEG recordings, annotated by a human observer
Keywords
electroencephalography; medical signal detection; 5th order autoregressive model; EEG-derived parameters; artefacts identification; clinical EEG recordings; electrodiagnostics; experimental cumulative distribution function; human observer; neuromonitoring; outlier detection; supervised training; threshold detection rules; training set; Accuracy; Biomedical measurements; Brain modeling; Distribution functions; Electroencephalography; Humans; Impedance; Signal processing; Testing; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1094-687X
Print_ISBN
0-7803-6465-1
Type
conf
DOI
10.1109/IEMBS.2000.901453
Filename
901453
Link To Document