DocumentCode
2855774
Title
Sequential detection with limited memory
Author
Ertin, Emre ; Potter, Lee C.
Author_Institution
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
fYear
2003
fDate
28 Sept.-1 Oct. 2003
Firstpage
585
Lastpage
588
Abstract
Sequential tests outperform fixed sample size tests by requiring fewer samples on average to achieve the same level of error performance. The sequential probability ratio test (SPRT) has been suggested by Wald (1947) for sequential binary hypothesis testing problems. SPRT recursively calculates the likelihood of an observed data stream and requires this likelihood to be stored in memory between samples. In this paper we study the design of sequential detection tests under memory constraints. We derive the optimal sequential test in the case where only a quantized version of the likelihood can be stored in memory. An application of the proposed techniques is large scale sensor networks where price and communication constraints dictate limited complexity devices, which store and transmit concise representations of the state of nature.
Keywords
Bayes methods; dynamic programming; probability; sampling methods; sensors; data stream; large scale sensor networks; sequential binary hypothesis testing; sequential detection tests; sequential probability ratio test; Automata; Cost function; Detectors; Large-scale systems; Memory management; Probability; Quantization; Sequential analysis; Statistical analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Signal Processing, 2003 IEEE Workshop on
Print_ISBN
0-7803-7997-7
Type
conf
DOI
10.1109/SSP.2003.1289542
Filename
1289542
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