• DocumentCode
    2855774
  • Title

    Sequential detection with limited memory

  • Author

    Ertin, Emre ; Potter, Lee C.

  • Author_Institution
    Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2003
  • fDate
    28 Sept.-1 Oct. 2003
  • Firstpage
    585
  • Lastpage
    588
  • Abstract
    Sequential tests outperform fixed sample size tests by requiring fewer samples on average to achieve the same level of error performance. The sequential probability ratio test (SPRT) has been suggested by Wald (1947) for sequential binary hypothesis testing problems. SPRT recursively calculates the likelihood of an observed data stream and requires this likelihood to be stored in memory between samples. In this paper we study the design of sequential detection tests under memory constraints. We derive the optimal sequential test in the case where only a quantized version of the likelihood can be stored in memory. An application of the proposed techniques is large scale sensor networks where price and communication constraints dictate limited complexity devices, which store and transmit concise representations of the state of nature.
  • Keywords
    Bayes methods; dynamic programming; probability; sampling methods; sensors; data stream; large scale sensor networks; sequential binary hypothesis testing; sequential detection tests; sequential probability ratio test; Automata; Cost function; Detectors; Large-scale systems; Memory management; Probability; Quantization; Sequential analysis; Statistical analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Statistical Signal Processing, 2003 IEEE Workshop on
  • Print_ISBN
    0-7803-7997-7
  • Type

    conf

  • DOI
    10.1109/SSP.2003.1289542
  • Filename
    1289542