A Comparison of Redundant Inverter Topologies to Improve Voltage Source Inverter Reliability

Author

Julian, Alexander L. ; Oriti, Giovanna

Author_Institution

Dept. of Elec. & Comp Eng., Naval Postgraduate Sch., Monterey, CA

Volume

4

fYear

2006

fDate

8-12 Oct. 2006

Firstpage

1674

Lastpage

1678

Abstract

For applications sensitive to reliability typical voltage source inverters cannot always meet the reliability requirements. In these cases some method of redundancy is used to improve system reliability. This paper compares the reliability of two redundant voltage source inverter (VSI) circuit topologies to a typical voltage source inverter circuit. The redundant circuits function normally after the failure (open or short) of any single component including the controller, current and voltage sensors, capacitors, IGBTs and power diodes. The parts count method of reliability comparison described in MIL-HDBK-217F is used to compare the reliability functions for the 3 circuit topologies

Keywords

circuit reliability; invertors; network topology; MIL-HDBK-217F; capacitors; circuit topologies; current sensors; insulated gate bipolar transistors; power diodes; redundant circuits; redundant inverter topologies; system reliability; voltage sensors; voltage source inverter reliability; Capacitors; Circuit topology; Diodes; Insulated gate bipolar transistors; Inverters; Power system reliability; Redundancy; Switches; Switching circuits; Voltage; MTBF; redundancy; reliability; voltage source inverter;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE

Conference_Location

Tampa, FL

ISSN

0197-2618

Print_ISBN

1-4244-0364-2

Electronic_ISBN

0197-2618

Type

conf

DOI

10.1109/IAS.2006.256761

Filename

4025449