Title :
A transparent-electrode CCD image sensor
Author :
Melen, R. ; Meindl, J.
Author_Institution :
Stanford University, Stanford, CA, USA
Abstract :
Results of an investigation of the performance of a transparent polycrystalline silicon electrode CCD image sensor will be presented, citing the fundamental limits of the charge transfer efficiency of the sensors imposed by slow and fast surface states, and carrier drift and diffusion at low, medium and high transfer efficiencies.
Keywords :
Capacitors; Charge coupled devices; Charge-coupled image sensors; Clocks; Electrodes; Frequency; Optical refraction; Optical surface waves; Silicon; Surface waves;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1973.1155215
