Title :
CCD memory options
Author :
Collins, David ; Barton, Jay H. ; Buss, D. ; Kmetz, A. ; Schroeder, Jochen
Author_Institution :
Texas Instruments Corp., Dallas, TX, USA
Abstract :
Implementation of Al-Al2O3-Al metalization, experimental performance of diverse CCDs, and a novel two-phase concept will be presented, within a discussion of the organization and fabrication tradeoffs for analog and digital memories, citing predicted impact.
Keywords :
Aluminum; Charge coupled devices; Clocks; Conductivity; Electrodes; Fluid flow measurement; Metallization; Phased arrays; Shift registers; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1973 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1973.1155221
