Title :
Resonator probe for near-field scanning microwave microscope
Author :
Gordienko, Yu.Ye. ; Ryabukhin, A.A. ; Slipchenko, N.I. ; Ananyin, V.V.
Author_Institution :
Kharkov Nat. Univ. of Radioelectron.
Abstract :
Resonator probe, operating at 35.7 GHz and based on the connected cavity and coaxial resonators, has been developed. Sample insertion in a field of the probe results in simultaneous change of resonance frequency and Q-factor of the resonator that allows to determine characteristics of the sample analyzed. On the basis of described resonator probe the model prototype of a near-field scanning microwave microscope for local contactless micro-diagnostics of physicomechanical, electric and photo-electric properties of substances, including semiconductors, dielectric materials, conductors and superconducting materials, and also sandwich structures on their basis has been created
Keywords :
Q-factor; dielectric materials; scanning probe microscopy; superconducting cavity resonators; 35.7 GHz; Q-factor; cavity resonator; coaxial resonator; dielectric material; near-field scanning microwave microscope; photo-electric property; physicomechanical property; resonator probe; superconducting material; Coaxial components; Conducting materials; Dielectric materials; Microscopy; Probes; Prototypes; Q factor; Resonance; Resonant frequency; Superconducting materials;
Conference_Titel :
Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-80-4
DOI :
10.1109/CRMICO.2005.1565108
