• DocumentCode
    2856205
  • Title

    Measure of non-standard systems of Z- and S-parameters for microwave two-ports

  • Author

    Filinyuk, N.A. ; Ogorodnik, K.V. ; Saleh, M.M.J.

  • Author_Institution
    Vinnitsa Nat. Tech. Univ.
  • Volume
    2
  • fYear
    2005
  • fDate
    16-16 Sept. 2005
  • Firstpage
    739
  • Abstract
    Measuring method of non-standard systems of Z- and S-parameters for microwave two-ports by measuring of complex reflection coefficients from input (output) of two-port with arbitrary loads is considered
  • Keywords
    S-parameters; microwave devices; microwave measurement; two-port networks; S-parameters; Z- parameters; complex reflection coefficient; microwave two-port network; nonstandard system; Helium; IEEE catalog; Microwave measurements; Microwave technology; Organizing; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2005 15th International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    966-7968-80-4
  • Type

    conf

  • DOI
    10.1109/CRMICO.2005.1565116
  • Filename
    1565116
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2856205