Title :
CCD memory arrays with fast access by on-chip decoding
Author :
Rosenbaum, S. ; Caves, J.
Author_Institution :
Bell-Northern Res., Ottawa, Canada
Keywords :
Bonding; Charge coupled devices; Circuit testing; Clocks; Decoding; Design optimization; Electrodes; Integrated circuit interconnections; Semiconductor device measurement; Silicon;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155236
