Title :
Analysis on the reliability of IED and GOOSE network in 500kV substation based on IEC61850 standard
Author :
Yang, Song ; Diqiu, Shen ; Ming, Li ; Jimeng, Pan ; Yan, Tan
Author_Institution :
China Southern Grid Extra High Voltage, Transm. Co. Liuzhou Bur., Liuzhou, China
Abstract :
The IEC61850 standard is the next generation of power substation. The reliability of IEC61850 substation more and more depends on new Intelligence Electronic Device (IED) and General Object Oriented Substation Event (GOOSE) network. As the highest voltage level IEC 61850 substation in China, all of IED and GOOSE network in 500kV Guilin substation were carefully tested, dynamic simulated and put into practice. The paper introduced general situation about 500kV Guilin IEC 61850 substation. After that, the paper summarized problems about this new generation technology appeared in simulation and factual operation. Finally the paper concluded the IEC61850 devices and network is reliable in 500kV substation.
Keywords :
IEC standards; power engineering computing; power system reliability; substation automation; substation protection; GOOSE network; IEC 61850 standard; IED reliability; general object oriented substation event network; intelligence electronic device; power substation; voltage 500 kV; Computer network reliability; IEC standards; Power system dynamics; Power system reliability; Reliability; Substations; GOOSE; IEC 61850 standard; IED; substation reliability;
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
DOI :
10.1109/ICCASM.2010.5622132
