• DocumentCode
    2856387
  • Title

    Functional verification of networked embedded systems

  • Author

    Bombieri, Nicola ; Fummi, Franco ; Pravadelli, Nicola Bombieri Franco Fummi Graziano

  • Author_Institution
    Dipt. di Inf., Verona Univ., Italy
  • fYear
    2005
  • fDate
    21-23 March 2005
  • Firstpage
    321
  • Lastpage
    326
  • Abstract
    We propose an automatic mechanism to extract the environment of a networked embedded system (NEV), and a functional verification methodology, which mixes automatic test pattern generation and model checking, exploiting the network environment constraints.
  • Keywords
    automatic test pattern generation; embedded systems; integrated circuit modelling; ATPG; automatic test pattern generation; functional verification methodology; model checking; networked embedded systems; Automatic test pattern generation; Circuit faults; Circuit testing; Electrical fault detection; Embedded system; Fault detection; Logic testing; Sequential analysis; Switches; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
  • Print_ISBN
    0-7695-2301-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2005.59
  • Filename
    1410603
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2856387